Neural networks applied to the determination of thickness and defocus from High Resolution Transmission Electron Microscopy images
نویسندگان
چکیده
In this paper we show how neural networks can be used as powerful tools for quantitative extraction of relevant information from high resolution transmission electron microscopy (HRTEM) images. Different data preprocessing and modelling strategies (including Multilayer Perceptrons and Probabilistic Neural Networks) were analyzed. The methodology has been applied to the determination of thickness and defocus from HRTEM images corresponding to GaN structures with wurtzite crystalline structure using a field emission gun JEOL 2010F equipped with an energy filter.
منابع مشابه
Super-resolution of Defocus Blurred Images
Super-resolution is a process that combines information from some low-resolution images in order to produce an image with higher resolution. In most of the previous related work, the blurriness that is associated with low resolution images is assumed to be due to the integral effect of the acquisition device’s image sensor. However, in practice there are other sources of blurriness as well, inc...
متن کاملImproving Super-resolution Techniques via Employing Blurriness Information of the Image
Super-resolution (SR) is a technique that produces a high resolution (HR) image via employing a number of low resolution (LR) images from the same scene. One of the degradations that attenuates performance of the SR is the blurriness of the input LR images. In many previous works in the SR, the blurriness of the LR images is assumed to be due to the integral effect of the image sensor of the im...
متن کاملNew methods for electron tomography
Transmission electron microscopy images acquired under tilted-beam conditions experience an image shift as a function of defocus settings—a fact that is exploited as a method for defocus determination in most of the automated tomography data collection systems. While the method was shown to be highly accurate for a large variety of specimens, we point out that in its original design it can stri...
متن کاملPrecision of three-dimensional atomic scale measurements from HRTEM images: what are the limits?
In this paper, we investigate to what extent high resolution transmission electron microscopy images can be used to measure the mass, in terms of thickness, and surface profile, corresponding to the defocus offset, of an object at the atomic scale. Therefore, we derive an expression for the statistical precision with which these object parameters can be estimated in a quantitative analysis. Eva...
متن کاملAccuracy of surface strain measurements from transmission electron microscopy images of nanoparticles
Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that ab...
متن کامل